Crack analysis in bimaterial interfaces using T-spline based XIGA

Analysis-suitable T-splines are used for the modeling and analyzing of cracks in bimaterial
interfaces within the framework of an extended isogeometric analysis (XIGA). The crack tip
enrichment functions of bimaterial interface cracks are implemented to reproduce singular
fields, and the signed distance functions are used to treat the crack face and the interface
in the models. A compatible local refinement algorithm is applied to refine location of the
crack and the interface, which helps one to avoid produce excessive propagation of control
points. The mixed mode stress intensity factors (SIFs) which are evaluated by the interaction
integral (M-integral) are used as analysis parameters. Numerical simulations are performed
to analyze the problem and to examine the efficiency of the proposed method. The obtained
results are compared with other available results.